Title :
Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency
Author :
Trémouilles, David ; Bafleur, Marise ; Bertrand, Géraldine ; Nolhier, Nicolas ; Mauran, Nicolas ; Lescouzères, Lionel
Author_Institution :
LAAS-CNRS, Toulouse, France
Abstract :
In this paper, we show how latch-up guard rings, surrounding electrostatic discharges (ESD) protection devices, can reduce the overall performance of the ESD protection scheme. This issue is addressed by TCAD simulation and experimental results. Design guidelines to cope with this problem are proposed.
Keywords :
electrostatic discharge; integrated circuit design; technology CAD (electronics); ESD protection devices; TCAD simulation and; electrostatic discharge protection; latch-up guard rings; latch-up ring design guidelines; CMOS technology; Circuit simulation; Circuit testing; Clamps; Electrostatic discharge; Guidelines; Integrated circuit technology; Protection; Rails; Robustness;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.833764
