• DocumentCode
    1113562
  • Title

    Parasitic element influence on the wide-band electrical noise and modulation response of semiconductor lasers

  • Author

    Andrekson, Peter A. ; Andersson, Per

  • Author_Institution
    Chalmers University of Technology, Gothenburg, Sweden
  • Volume
    23
  • Issue
    6
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    1048
  • Lastpage
    1053
  • Abstract
    The influence of parasitic elements on the wide-band electrical noise in GaAlAs BH-BOG lasers is investigated theoretically and experimentally. The results show that the maximum small-signal modulation bandwidth can be determined from measurements of the electrical noise spectrum. A small difference of the peak frequency in the optical intensity noise and the peak frequency in the electrical noise spectra is observed (about 200 MHz), and it is explained by introducing the nonlinear intrinsic diode impedance in the parasitic element model. However, the peak frequency in the small-signal modulation response spectrum coincides with the peak frequency in the electrical noise spectrum. It is also shown that the spectral line width, calculated from electrical noise measurements, is not significantly affected by the parasitic element filtering. The electrical noise level is observed to approach an inverse output power dependence at high pumping rates, in good agreement with theoretical calculations.
  • Keywords
    Gallium materials/lasers; Laser noise; Optical modulation/demodulation; Bandwidth; Electric variables measurement; Frequency; Laser noise; Laser theory; Noise measurement; Optical noise; Semiconductor device noise; Semiconductor lasers; Wideband;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.1987.1073417
  • Filename
    1073417