• DocumentCode
    1113640
  • Title

    Large transconductance n+-Ge gate AlGaAs/GaAs MISFET with thin gate insulator

  • Author

    Maezawa, Koichi ; Mizutani, Takashi ; Arai, Kunihiro ; Yanagawa, Fumihiko

  • Author_Institution
    NTT Electrical Communications Laboratories, Kanagawa, Japan
  • Volume
    7
  • Issue
    7
  • fYear
    1986
  • fDate
    7/1/1986 12:00:00 AM
  • Firstpage
    454
  • Lastpage
    456
  • Abstract
    The effects of insulator layer thickness on an n+-Ge gate MISFET were studied. The transconductance increases with decreasing AlGaAs layer thickness from 60 down to 10 nm. From the variation of the intrinsic transconductance, the effective insulator layer thickness was found to be enlarged by about 9 nm. This is due to the finite width of two-dimensional electron gas (2-DEG). A large transconductance of 430 mS/ mm was obtained at room temperature for the 0.8-µm gate-length FET with 10-nm-thick AlGaAs. This large transconductance demonstrates the inherent potential of the n+-Ge gate MISFET for LSI application.
  • Keywords
    Electrons; FETs; Gallium arsenide; Heterojunctions; Insulation; MISFETs; MODFET integrated circuits; Temperature; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1986.26434
  • Filename
    1486257