DocumentCode
1113640
Title
Large transconductance n+-Ge gate AlGaAs/GaAs MISFET with thin gate insulator
Author
Maezawa, Koichi ; Mizutani, Takashi ; Arai, Kunihiro ; Yanagawa, Fumihiko
Author_Institution
NTT Electrical Communications Laboratories, Kanagawa, Japan
Volume
7
Issue
7
fYear
1986
fDate
7/1/1986 12:00:00 AM
Firstpage
454
Lastpage
456
Abstract
The effects of insulator layer thickness on an n+-Ge gate MISFET were studied. The transconductance increases with decreasing AlGaAs layer thickness from 60 down to 10 nm. From the variation of the intrinsic transconductance, the effective insulator layer thickness was found to be enlarged by about 9 nm. This is due to the finite width of two-dimensional electron gas (2-DEG). A large transconductance of 430 mS/ mm was obtained at room temperature for the 0.8-µm gate-length FET with 10-nm-thick AlGaAs. This large transconductance demonstrates the inherent potential of the n+-Ge gate MISFET for LSI application.
Keywords
Electrons; FETs; Gallium arsenide; Heterojunctions; Insulation; MISFETs; MODFET integrated circuits; Temperature; Threshold voltage; Transconductance;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1986.26434
Filename
1486257
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