• DocumentCode
    111396
  • Title

    High Overload Pressure Sensor Construct With Polysilicon Nanofilm

  • Author

    Chuai Rongyan ; Wang Jian ; Yi Chang ; Dai Quan ; Yang Lijian

  • Author_Institution
    Sch. of Inf. Sci. & Eng., Shenyang Univ. of Technol., Shenyang, China
  • Volume
    15
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    1414
  • Lastpage
    1420
  • Abstract
    A high overload pressure sensor is prepared by surface micromachined technology, and its full scale pressure is 2.5 MPa. The structure of the proposed sensor is based on a seal cavity made by sacrificial layer, a deposition of polysilicon nanofilm acts as piezoresistors on the diaphragm. The stress distribution of the diaphragm of the sensor is simulated by the large displacement static analysis and the nonlinear contact analysis. Due to polysilicon high tensile strength and appropriate cavity height, the sensor full scale output voltage and overload capacity is greatly improved. The measured results indicate that the overpressure of the sensor sample is seven times higher than its full-scale pressure, and its full scale output voltage is 362 mV with a supply voltage of 5 V.
  • Keywords
    diaphragms; elemental semiconductors; micromachining; microsensors; nanosensors; nanostructured materials; pressure sensors; seals (stoppers); silicon; stress measurement; tensile strength; thin film sensors; Si; diaphragm; high overload pressure sensor; large displacement static analysis; nonlinear contact analysis; piezoresistor; polysilicon nanofilm deposition; pressure 2.5 MPa; sacrificial layer; seal cavity; stress distribution; surface micromachined technology; tensile strength; voltage 362 mV; voltage 5 V; Cavity resonators; Piezoresistive devices; Sensitivity; Sensors; Strain; Stress; Substrates; Pressure sensor; overload protection; polysilicon nanofilm; sacrificial layer;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2014.2363481
  • Filename
    6926739