DocumentCode
1113995
Title
Exploring Variability and Performance in a Sub-200-mV Processor
Author
Hanson, Scott ; Zhai, Bo ; Seok, Mingoo ; Cline, Brian ; Zhou, Kevin ; Singhal, Meghna ; Minuth, Michael ; Olson, Javin ; Nazhandali, Leyla ; Austin, Todd ; Sylvester, Dennis ; Blaauw, David
Author_Institution
Univ. of Michigan, Ann Arbor
Volume
43
Issue
4
fYear
2008
fDate
4/1/2008 12:00:00 AM
Firstpage
881
Lastpage
891
Abstract
In this study, we explore the design of a subthreshold processor for use in ultra-low-energy sensor systems. We describe an 8-bit subthreshold processor that has been designed with energy efficiency as the primary constraint. The processor, which is functional below Vdd=200 mV, consumes only 3.5 pJ/inst at Vdd=350 mV and, under a reverse body bias, draws only 11 nW at Vdd=160 mV. Process and temperature variations in subthreshold circuits can cause dramatic fluctuations in performance and energy consumption and can lead to robustness problems. We investigate the use of body biasing to adapt to process and temperature variations. Test-chip measurements show that body biasing is particularly effective in subthreshold circuits and can eliminate performance variations with minimal energy penalties. Reduced performance is also problematic at low voltages, so we investigate global and local techniques for improving performance while maintaining energy efficiency.
Keywords
energy consumption; low-power electronics; sensors; energy consumption; subthreshold circuits; subthreshold processor; ultra-low-energy sensor systems; Circuit testing; Energy consumption; Energy efficiency; Energy measurement; Fluctuations; Low voltage; Particle measurements; Robustness; Sensor systems; Temperature; Low voltage; process variation; sensor network processing; subthreshold;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2008.917505
Filename
4476487
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