Title :
Fast electrical and optical measurements
Author :
Diels, Jean-Claude
Author_Institution :
Dept. of Physics, Univ. of New Mexico, Albuquerque, NM, USA
fDate :
7/1/1987 12:00:00 AM
Keywords :
Book reviews; Plasma measurements; Ultrafast optics; Books; Conference proceedings; EMP radiation effects; Electric variables measurement; Grounding; Holography; Optical pulses; Plasma diagnostics; Pulse measurements; Ultrafast optics;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1987.1073470