Title :
A 1.35 GS/s, 10 b, 175 mW Time-Interleaved AD Converter in 0.13 µm CMOS
Author :
Louwsma, Simon M. ; van Tuijl, A.J.M. ; Vertregt, Maarten ; Nauta, Bram
Author_Institution :
Univ. of Twente, Enschede
fDate :
4/1/2008 12:00:00 AM
Abstract :
A time-interleaved ADC is presented with 16 channels, each consisting of a track-and-hold (T&H) and two successive approximation (SA) ADCs in a pipeline configuration to combine a high sample rate with good power efficiency. The single-sided overrange architecture achieves a 25% higher power efficiency of the SA-ADC compared with the conventional overrange architecture, and look-ahead logic is used to minimize logic delay in the SA-ADC. For the T&H, three techniques are presented enabling a high bandwidth and linearity and good timing alignment. Single channel performance of the ADC is 6.9 ENOB at an input frequency of 4 GHz. Multichannel performance is 7.7 ENOB at 1.35 GS/s with an ERBW of 1 GHz. The FoM of the complete ADC including T&H is 0.6 pJ per conversion step. An improved version is presented as well and achieves an SNDR of 8.6 ENOB for low sample rates, and, with increased supply voltage, it reaches a sample rate of 1.8 GS/s with 7.9 ENOB at low input frequencies and an ERBW of 1 GHz. At fin = 3.6 GHz, the SNDR is still 6.5 ENOB, and total timing error including jitter is 0.4 ps rms.
Keywords :
CMOS integrated circuits; analogue-digital conversion; delays; minimisation; CMOS; analog-to-digital converter; frequency 1 GHz; frequency 3.6 GHz; frequency 4 GHz; look-ahead logic; power 175 mW; power efficiency; size 0.13 mum; time 0.4 ps; time-interleaved AD converter; track-and-hold channels; Bandwidth; Calibration; Capacitance; Frequency; Interleaved codes; Linearity; Logic; Pipelines; Sampling methods; Timing jitter; Analog-to-digital converter (ADC); SAR; bandwidth mismatch; high-speed sampling; jitter; pipeline; successive approximation ADC (SA-ADC); time-interleaved; time-interleaving; timing; timing alignment; track-and-hold (T&H);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.917427