Title :
A Design Method and Developments of a Low-Power and High-Resolution Multiphase Generation System
Author :
Matsumoto, Akinori ; Sakiyama, Shiro ; Tokunaga, Yusuke ; Morie, Takashi ; Dosho, Shiro
Author_Institution :
Matsushita Electr. Ind. Co., Ltd., Osaka
fDate :
4/1/2008 12:00:00 AM
Abstract :
A practical method for coupled oscillator design is elaborated. The topology analysis of a coupled oscillator, the ways of simulating its sensitivity, initializing its operation, and the oscillation frequency enhancement with nMOS phase couplers are presented. We have developed a write strategy system for DVD with a coupled oscillator using these techniques. In addition, we have also developed a low-power-oriented multiphase generator for mobile phones with our newly devised multiphase level shift system (M-LS). The M-LS has established superiority in its low power consumption because of no short current. Moreover, we have applied the method of output phase-accuracy improvement using a resistor ring to the M-LS. Two test chips are fabricated and the design method is validated. The first coupled oscillator has a resolution of 32 ps and a phase accuracy of -1.0 to 0.8 LSB at 490 MHz, corresponding to 16times DVD write speed. The second one consumes 1 mA and has a high phase accuracy of 0.5 LSB at 123 MHz.
Keywords :
coupled circuits; digital versatile discs; low-power electronics; mobile handsets; oscillators; sensitivity analysis; DVD; coupled oscillator; high-resolution multiphase generation system; low-power multiphase generation system; mobile phones; multiphase level shift system; nMOS phase couplers; operation initialization; oscillation frequency enhancement; output phase-accuracy improvement; resistor ring; sensitivity analysis; topology analysis; write strategy; Analytical models; Couplers; DVD; Design methodology; Energy consumption; Frequency; MOS devices; Mobile handsets; Oscillators; Topology; Coupled ring oscillator; level shifter; multiphase; phase-locked loop (PLL);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.917567