Title :
Resonant-Clock Latch-Based Design
Author :
Sathe, Visvesh S. ; Kao, Jerry C. ; Papaefthymiou, Marios C.
Author_Institution :
Adv. Micro Devices, Fort Collins
fDate :
4/1/2008 12:00:00 AM
Abstract :
This paper describes RF1 and RF2, two level-clocked test-chips that deploy resonant clocking to reduce power consumption in their clock distribution networks. It also highlights RCL, a novel resonant-clock latch-based methodology that was used to design the two test-chips. RF1 and RF2 are 8-bit 14-tap finite-impulse response (FIR) filters with identical architectures. Designed using a fully automated ASIC design flow, they have been fabricated in a commercial 0.13 mum bulk silicon process. RF1 operates at clock frequencies in the 0.8-1.2 GHz range and uses a single-phase clocking scheme with a driven clock generator. Resonating its 42 pF clock load at 1.03 GHz with Vdd = 1.13 V, RF1 dissipates 132 mW, achieving a clock power reduction of 76% over conventional switching. RF2 achieves higher clock power efficiency than RF1 by relying on a two-phase clocking scheme with a distributed self-resonant clock generator. Resonating 38 pF of clock load per phase at 1.01 GHz with Vdd = 1.08 V, RF2 dissipates 124 mW and achieves 84% reduction in clock power over conventional switching. At 133 nW/MHz/Tap/InBit/CoeffBit, RF2 features the lowest figure of merit for FIR filters published to date.
Keywords :
FIR filters; application specific integrated circuits; clocks; flip-flops; integrated circuit design; logic design; low-power electronics; FIR filters; automated ASIC design; clock distribution networks; finite-impulse response filters; frequency 0.8 GHz to 1.2 GHz; resonant-clock latch-based design; size 0.13 mum; two level-clocked test-chips; Application specific integrated circuits; Clocks; Distributed power generation; Energy consumption; Finite impulse response filter; Frequency; Power generation; Resonance; Silicon; Testing; Digital signal processing; low-power VLSI;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.917501