DocumentCode :
1114243
Title :
A 70 nm 16 Gb 16-Level-Cell NAND flash Memory
Author :
Shibata, N. ; Maejima, H. ; Isobe, K. ; Iwasa, K. ; Nakagawa, M. ; Fujiu, M. ; Shimizu, T. ; Honma, M. ; Hoshi, S. ; Kawaai, T. ; Kanebako, K. ; Yoshikawa, S. ; Tabata, H. ; Inoue, A. ; Takahashi, T. ; Shano, T. ; Komatsu, Y. ; Nagaba, K. ; Kosakai, M. ;
Author_Institution :
Toshiba Corp. Semicond. Co., Yokohama
Volume :
43
Issue :
4
fYear :
2008
fDate :
4/1/2008 12:00:00 AM
Firstpage :
929
Lastpage :
937
Abstract :
A 16 Gb 16-level-cell (16LC) NAND flash memory using 70 nm design rule has been developed . This 16LC NAND flash memory can store 4 bits in a cell which enabled double bit density comparing to 4-level-cell (4LC) NAND flash, and quadruple bit density comparing to single-bit (SLC) NAND flash memory with the same design rule. New programming method suppresses the floating gate coupling effect and enabled the narrow distribution for 16LC. The cache-program function can be achievable without any additional latches. Optimization of programming sequence achieves 0.62 MB/s programming throughput. This 16-level NAND flash memory technology reduces the cost per bit and improves the memory density even more.
Keywords :
NAND circuits; cache storage; flash memories; optimisation; NAND flash Memory; bit rate 0.62 Mbit/s; cache-program function; floating gate coupling effect; memory size 16 GByte; programming sequence optimization; quadruple bit density; size 70 nm; Cellular phones; Costs; Demand forecasting; Digital cameras; Economic forecasting; History; Nonvolatile memory; Throughput; Universal Serial Bus; NAND flash memory; flash memory; floating gate coupling effect; multi-level cell;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2008.917559
Filename :
4476510
Link To Document :
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