DocumentCode :
1114407
Title :
Electron velocity overshoot in the collector depletion layer of AlGaAs/GaAs HBT´s
Author :
Yamauchi, Yoshiki ; Ishibashi, Tadab
Author_Institution :
NTT Electrical Communication Laboratories, Kanagawa, Japan
Volume :
7
Issue :
12
fYear :
1986
fDate :
12/1/1986 12:00:00 AM
Firstpage :
655
Lastpage :
657
Abstract :
Electron velocity in the collector depletion layer of AlGaAs/ GaAs heterojunction bipolar transistors (HBT´s) is characterized by analyzing the cutoff frequencies. The ftvalue of tested HBT´s was 40 GHz at a collector voltage VCEof 2 V, and it significantly decreased to 27 GHz at VCE= 5 V. A conventional model assuming a constant electron velocity in the collector depletion region does not account for this ftvariation. A new simple model composed of a velocity overshoot region and a saturation velocity region is proposed and it successfully explains the variation.
Keywords :
Capacitance measurement; Cutoff frequency; Doping; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Information analysis; Testing; Transient analysis; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1986.26509
Filename :
1486332
Link To Document :
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