• DocumentCode
    1114725
  • Title

    Noise in relaxation-oscillation-driven DC SQUIDs

  • Author

    Gugoshnikov, S.A. ; Kaplunenko, O.V. ; Maslennikov, Yu.V. ; Snigirev, O.V.

  • Author_Institution
    Dept. of Phys., Moscow State Univ., USSR
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    2439
  • Lastpage
    2441
  • Abstract
    The noise properties of the simple relaxation-oscillation-driven DC SQUIDs (RO-SQUIDs) have been studied. A limitation of its internal energy sensitivity Ev at a level close to 4×10 -31 J/Hz due to the influence of the Josephson junction plasma oscillation has been found for the 5-μm-design-rule technology. The signal characteristics with the transfer flux-to-voltage factor up to 2 mV/Φ0 and equivalent noise flux of about 1.3×10-6 Φ0/Hz1/2 in the new all-niobium version of the balanced RO-SQUID have been measured
  • Keywords
    Josephson effect; SQUIDs; electron device noise; relaxation oscillators; 5 micron; DC SQUIDs; Josephson junction plasma oscillation; Nb; equivalent noise flux; internal energy sensitivity; noise properties; relaxation-oscillation-driven; signal characteristics; transfer flux-to-voltage factor; Frequency; Magnetic flux; Magnetic noise; Noise measurement; Optimized production technology; Plasma measurements; Plasma properties; SQUIDs; Switches; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133711
  • Filename
    133711
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1114725