Title :
Noise in relaxation-oscillation-driven DC SQUIDs
Author :
Gugoshnikov, S.A. ; Kaplunenko, O.V. ; Maslennikov, Yu.V. ; Snigirev, O.V.
Author_Institution :
Dept. of Phys., Moscow State Univ., USSR
fDate :
3/1/1991 12:00:00 AM
Abstract :
The noise properties of the simple relaxation-oscillation-driven DC SQUIDs (RO-SQUIDs) have been studied. A limitation of its internal energy sensitivity Ev at a level close to 4×10 -31 J/Hz due to the influence of the Josephson junction plasma oscillation has been found for the 5-μm-design-rule technology. The signal characteristics with the transfer flux-to-voltage factor up to 2 mV/Φ0 and equivalent noise flux of about 1.3×10-6 Φ0/Hz1/2 in the new all-niobium version of the balanced RO-SQUID have been measured
Keywords :
Josephson effect; SQUIDs; electron device noise; relaxation oscillators; 5 micron; DC SQUIDs; Josephson junction plasma oscillation; Nb; equivalent noise flux; internal energy sensitivity; noise properties; relaxation-oscillation-driven; signal characteristics; transfer flux-to-voltage factor; Frequency; Magnetic flux; Magnetic noise; Noise measurement; Optimized production technology; Plasma measurements; Plasma properties; SQUIDs; Switches; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
