Title :
Asynchronous Sequential Machines Designed for Fault Detection
Author :
Sawin, Dwight H., III ; Maki, Gary K.
Author_Institution :
Naval Electronics Laboratory Center
fDate :
3/1/1974 12:00:00 AM
Abstract :
A design procedure is presented which allows for detection of faults in asynchronous sequential machines in a real time environment. Faults affecting both the output states and the internal operation of the machine are detected. The class of faults initially considered are single stuck-at-1 and stuck-at-0 faults. However, since the detection system presented is static and continuous, the class of faults detected will be greatly extended to include intermittent and a large number of multiple faults.
Keywords :
Asynchronous sequential machine design, fault detection, fault masking, reliability, self-testable machines.; Built-in self-test; Circuit faults; Electrical fault detection; Equations; Fault detection; Impedance matching; Logic circuits; Logic design; Sequential analysis; Testing; Asynchronous sequential machine design, fault detection, fault masking, reliability, self-testable machines.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1974.223918
