• DocumentCode
    1115074
  • Title

    Practical limits for optical test of spatial resolution in advanced imaging devices

  • Author

    Bársony, István ; Tanaka, Akimasa ; Niedra, Janis M. ; Nishizawa, Jun-ichi

  • Author_Institution
    Research Development Corporation of Japan
  • Volume
    34
  • Issue
    2
  • fYear
    1987
  • fDate
    2/1/1987 12:00:00 AM
  • Firstpage
    267
  • Lastpage
    270
  • Abstract
    Decreasing pixel size, perfection of isolation, and improved dynamic range of advanced imaging devices requires an adequate optical arrangement to check crosstalk behavior within the pixel matrix. The Fraunhofer diffraction pattern; an inherent feature of any focused circular beam, leads to unintended direct illumination of the neighbors even if accurately centered. A Simple setup has been applied to determine the beam profile focused down to the subwavelength range. We propose to characterize the beam focusing for spatial resolution tests by the first zero to-zero width independent of peak intensity. We provide an estimate of minimum requirements to be fulfilled in order to test for a given crosstalk and demonstrate their importance on filled trench-isolated pixels.
  • Keywords
    Dynamic range; Focusing; Lighting; Optical crosstalk; Optical devices; Optical diffraction; Optical imaging; Pixel; Spatial resolution; Testing;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.22917
  • Filename
    1486628