DocumentCode
1115074
Title
Practical limits for optical test of spatial resolution in advanced imaging devices
Author
Bársony, István ; Tanaka, Akimasa ; Niedra, Janis M. ; Nishizawa, Jun-ichi
Author_Institution
Research Development Corporation of Japan
Volume
34
Issue
2
fYear
1987
fDate
2/1/1987 12:00:00 AM
Firstpage
267
Lastpage
270
Abstract
Decreasing pixel size, perfection of isolation, and improved dynamic range of advanced imaging devices requires an adequate optical arrangement to check crosstalk behavior within the pixel matrix. The Fraunhofer diffraction pattern; an inherent feature of any focused circular beam, leads to unintended direct illumination of the neighbors even if accurately centered. A Simple setup has been applied to determine the beam profile focused down to the subwavelength range. We propose to characterize the beam focusing for spatial resolution tests by the first zero to-zero width independent of peak intensity. We provide an estimate of minimum requirements to be fulfilled in order to test for a given crosstalk and demonstrate their importance on filled trench-isolated pixels.
Keywords
Dynamic range; Focusing; Lighting; Optical crosstalk; Optical devices; Optical diffraction; Optical imaging; Pixel; Spatial resolution; Testing;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1987.22917
Filename
1486628
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