Title :
Testing for Faults in Wiring Networks
Author :
Kautz, William H.
Author_Institution :
Stanford Research Institute
fDate :
4/1/1974 12:00:00 AM
Abstract :
An algorithm is derived for multiprobe testing for shorts, opens, and wiring errors in any multiterminal wiring network, such as a printed circuit board, wiring harness, multiconductor cable, or backplane wiring board. For behavioral testing the minimum number of tests required, always achievable, is equal to p - 1 + [log2q], where p is the number of terminals in the largest interconnected cluster in the network, and q is the total number of clusters, including isolated terminals. For structural testing the number of tests required is less, and can be as small as [log2q] + 1 depending upon the assumptions made regarding the types of faults that can occur.
Keywords :
Behavioral testing, faults, structural testing, switching circuits, wiring networks.; Backplanes; Circuit faults; Circuit testing; Integrated circuit interconnections; Intelligent networks; Logic testing; Printed circuits; Switching circuits; Tree graphs; Wiring; Behavioral testing, faults, structural testing, switching circuits, wiring networks.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1974.223950
