DocumentCode :
1115204
Title :
Modeling of ambipolar a-Si:H thin-film transistors
Author :
Neudeck, Gerold W. ; Bare, Harold F. ; Chung, Kyo Y.
Author_Institution :
Purdue University, West Lafayette, IN
Volume :
34
Issue :
2
fYear :
1987
fDate :
2/1/1987 12:00:00 AM
Firstpage :
344
Lastpage :
350
Abstract :
Ambipolar hydrogenated amorphous silicon thin-film transistors are capable of both n- and p-channel device operation. Essential to the fabrication of such devices are ohmic source-drain contact regions and a high-quality low fixed charge gate insulator. A simple model has been developed to describe the output drain current versus drain voltage characteristics of these ambipolar devices, The model involves only the numerical integration of an interpolated sheet conductance function. By using the appropriate flat-band voltage, the model accurately predicts the experimental output drain current characteristics for both n- and p-type operation.
Keywords :
Amorphous silicon; Charge carrier processes; FETs; Helium; Insulation; Sensor arrays; Silicon compounds; Substrates; Thin film transistors; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1987.22928
Filename :
1486639
Link To Document :
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