• DocumentCode
    1115212
  • Title

    Safe operating area for 1200-V nonlatchup bipolar-mode MOSFET´s

  • Author

    Nakagawa, Akio ; Yamaguchi, Yoshihiro ; Watanabe, Kiminori ; Ohashi, Hiromichi

  • Author_Institution
    Toshiba Research and Development Center, Kawasaki, Japan
  • Volume
    34
  • Issue
    2
  • fYear
    1987
  • fDate
    2/1/1987 12:00:00 AM
  • Firstpage
    351
  • Lastpage
    355
  • Abstract
    This paper reports the safe operating area (SOA) for 1200-V nonlatchup bipolar-mode MOSFET\´s. The measured SOA limit, in terms of current density and drain-voltage product, reached 2.5 × 105W/cm2for 125°C-case temperature and 10-µs pulse operation conditions. It exceeded even the so-called "avalanche limit" for n-p-n bipolar transistors when the measurement was carried out under 25°C-case temperature conditions. These SOA\´s enable device protection from an abnormally large drain-current surge.
  • Keywords
    Bipolar transistors; Current density; Current measurement; Electrodes; MOSFET circuits; Protection; Pulse measurements; Semiconductor optical amplifiers; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.22929
  • Filename
    1486640