Title :
Safe operating area for 1200-V nonlatchup bipolar-mode MOSFET´s
Author :
Nakagawa, Akio ; Yamaguchi, Yoshihiro ; Watanabe, Kiminori ; Ohashi, Hiromichi
Author_Institution :
Toshiba Research and Development Center, Kawasaki, Japan
fDate :
2/1/1987 12:00:00 AM
Abstract :
This paper reports the safe operating area (SOA) for 1200-V nonlatchup bipolar-mode MOSFET\´s. The measured SOA limit, in terms of current density and drain-voltage product, reached 2.5 × 105W/cm2for 125°C-case temperature and 10-µs pulse operation conditions. It exceeded even the so-called "avalanche limit" for n-p-n bipolar transistors when the measurement was carried out under 25°C-case temperature conditions. These SOA\´s enable device protection from an abnormally large drain-current surge.
Keywords :
Bipolar transistors; Current density; Current measurement; Electrodes; MOSFET circuits; Protection; Pulse measurements; Semiconductor optical amplifiers; Temperature; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.22929