DocumentCode :
1115212
Title :
Safe operating area for 1200-V nonlatchup bipolar-mode MOSFET´s
Author :
Nakagawa, Akio ; Yamaguchi, Yoshihiro ; Watanabe, Kiminori ; Ohashi, Hiromichi
Author_Institution :
Toshiba Research and Development Center, Kawasaki, Japan
Volume :
34
Issue :
2
fYear :
1987
fDate :
2/1/1987 12:00:00 AM
Firstpage :
351
Lastpage :
355
Abstract :
This paper reports the safe operating area (SOA) for 1200-V nonlatchup bipolar-mode MOSFET\´s. The measured SOA limit, in terms of current density and drain-voltage product, reached 2.5 × 105W/cm2for 125°C-case temperature and 10-µs pulse operation conditions. It exceeded even the so-called "avalanche limit" for n-p-n bipolar transistors when the measurement was carried out under 25°C-case temperature conditions. These SOA\´s enable device protection from an abnormally large drain-current surge.
Keywords :
Bipolar transistors; Current density; Current measurement; Electrodes; MOSFET circuits; Protection; Pulse measurements; Semiconductor optical amplifiers; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1987.22929
Filename :
1486640
Link To Document :
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