• DocumentCode
    1115427
  • Title

    Emittance and the design of beam formation, transport, and collection systems in periodically focussed TWT´s

  • Author

    True, Richard

  • Author_Institution
    Litton Industries, San Carlos, CA
  • Volume
    34
  • Issue
    2
  • fYear
    1987
  • fDate
    2/1/1987 12:00:00 AM
  • Firstpage
    473
  • Lastpage
    485
  • Abstract
    This paper describes how emittance can be used to advantage in the design of beam optical systems for TWT´s and other devices, and presents progress on the quantitative intercoupling of the beam formation, capture, focussing, transport, and collection problems via a parameter called tunnel emittance (T-emittance). First, a thermal electron beam model for gun-design computer codes is presented. It is necessary to employ a thermal beam model for accurate determination of T-emittance at the beam waist (especially in diode and low-perveance guns). Next, the paper considers the beam capture problem. How the match between the beam and the periodic permanant magnet (PPM) focussing field affects T-emittance growth downstream is described. After this, the effect of tube length on beam transmission is considered. It is shown that T-emittance can grow downstream due to the transfer of nonlinear field energy to transverse beam motion (explaining the observed degradation in transmission in very long tubes). Finally, at the exit of the tube, the grown value of T-emittance can be used as the basis for a spent beam model useful for preliminary single and multistage depressed collector (MDC) simulations. Appendices are presented which relate the quantities used in this paper to those used within the high-energy physics community.
  • Keywords
    Degradation; Diodes; Electron beams; Electron optics; Guns; Nonlinear optics; Optical beams; Optical design; Optical devices; Stimulated emission;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.22949
  • Filename
    1486660