• DocumentCode
    1115791
  • Title

    Implementation of optical interconnections for VLSI

  • Author

    Wu, Wennie H. ; Bergman, Larrya ; Johnston, Alan R. ; Guest, Clark C. ; Esener, Sadik C. ; Yu, Paul K. L. ; Feldman, Michael R. ; Lee, Sing H.

  • Author_Institution
    California Institute of Technology, Pasadena, CA
  • Volume
    34
  • Issue
    3
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    706
  • Lastpage
    714
  • Abstract
    This paper reports on the progress in implementing optical interconnections for VLSI. Four areas are covered: 1) the holographic optical element (HOE), 2) the laser sources, 3) the detectors and associated circuits forming an optically addressed gate, and 4) interconnection experiments in which five gates are actuated from one source. A laser scanner system with a resolution of 12 µm × 20 µm has been utilized to generate the HOE´s. Diffraction efficiency of the HOE and diffracted spot size have been measured. Stock lasers have been modified with a high-frequency package for interconnect experiments, and buried heterostructure fabrication techniques have been pursued. Measurements have been made on the fabricated photodetectors to determine dark current, responsivity and response time. The optical gates and the overall chip have been driven successfully with an input light beam, as well as with the optical signal interconnected through the one to five hologram.
  • Keywords
    Holographic optical components; Holography; Integrated circuit interconnections; Optical device fabrication; Optical diffraction; Optical interconnections; Packaging; Semiconductor device measurement; Size measurement; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.22983
  • Filename
    1486694