• DocumentCode
    1115825
  • Title

    Locally Trained Piecewise Linear Classifiers

  • Author

    Sklansky, Jack ; Michelotti, Leo

  • Author_Institution
    SENIOR MEMBER, IEEE, Departments of Electrical Engineering, Information and Computer Science and Radiological Sciences, University of California, Irvine, CA 92717.
  • Issue
    2
  • fYear
    1980
  • fDate
    3/1/1980 12:00:00 AM
  • Firstpage
    101
  • Lastpage
    111
  • Abstract
    We describe a versatile technique for designing computer algorithms for separating multiple-dimensional data (feature vectors) into two classes. We refer to these algorithms as classifiers. Our classifiers achieve nearly Bayes-minimum error rates while requiring relatively small amounts of memory. Our design procedure finds a set of close-opposed pairs of clusters of data. From these pairs the procedure generates a piecewise-linear approximation of the Bayes-optimum decision surface. A window training procedure on each linear segment of the approximation provides great flexibility of design over a wide range of class densities. The data consumed in the training of each segment are restricted to just those data lying near that segment, which makes possible the construction of efficient data bases for the training process. Interactive simplification of the classifier is facilitated by an adjacency matrix and an incidence matrix. The adjacency matrix describes the interrelationships of the linear segments {£i}. The incidence matrix describes the interrelationships among the polyhedrons formed by the hyperplanes containing {£i}. We exploit switching theory to minimize the decision logic.
  • Keywords
    Algorithm design and analysis; Clustering algorithms; Error analysis; Logic; Low earth orbit satellites; Pattern recognition; Piecewise linear approximation; Piecewise linear techniques; Prototypes; Vectors; Bayes decision surface; classifier; cluster analysis; minimum logic; pattern recognition; prototypes; switching theory; window training procedure;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.1980.4766988
  • Filename
    4766988