• DocumentCode
    1115842
  • Title

    Two-dimensional analysis of emitter-size effect on current gain for GaAlAs/GaAs HBT´s

  • Author

    Hiraoka, Yoshiko Someya ; Yoshida, Jiro ; Azuma, Makoto

  • Author_Institution
    Toshiba Corporation, Kawasaki, Japan
  • Volume
    34
  • Issue
    4
  • fYear
    1987
  • fDate
    4/1/1987 12:00:00 AM
  • Firstpage
    721
  • Lastpage
    725
  • Abstract
    The current-gain dependence on emitter size (emitter-size effect) is theoretically investigated for GaAlAs/GaAs heterojunction bipolar transistors with an ion-implanted extrinsic base region, using a two-dimensional numerical model. It is clarified that the current gain degrades with a decrease in emitter size, depending on the carrier lifetimes in the extrinsic base region. From the calculated results, it is shown that the emitter-size effect is suppressed for a very-thin-base or a graded-base structure. On the other hand, the effect is enhanced for a double-heterostructure. These results are explained by taking account of the electron-density profile in the extrinsic base region. The mechanism of a lateral diffusion of electrons into the extrinsic base region is also discussed.
  • Keywords
    Aluminum; Charge carrier processes; Degradation; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Numerical models; Poisson equations; Region 3; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.22987
  • Filename
    1486698