DocumentCode :
1115851
Title :
Fault-Tolerance of the Iterative Cell Array Switch for Hybrid Redundancy
Author :
Ogus, Roy C.
Author_Institution :
Digital Systems Laboratory, Stanford University
Issue :
7
fYear :
1974
fDate :
7/1/1974 12:00:00 AM
Firstpage :
667
Lastpage :
681
Abstract :
The technique of hybrid redundancy has been used to protect those portions of a digital system which have to be made ultrareliable. Siewiorek and McCluskey have presented a new switch design for hybrid redundancy which is shown to be of less complexity than other switch designs presented in the literature.
Keywords :
Computer reliability, error-correcting codes, fail-safe logic, fault-tolerance, hybrid redundancy, iterative cell array, mission time, self-checking checker, threshold voter, triple modular redundancy (TMR).; Detectors; Digital systems; Fault tolerance; Fault tolerant systems; Hardware; Nuclear magnetic resonance; Protection; Redundancy; Reliability; Switches; Computer reliability, error-correcting codes, fail-safe logic, fault-tolerance, hybrid redundancy, iterative cell array, mission time, self-checking checker, threshold voter, triple modular redundancy (TMR).;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1974.224015
Filename :
1672608
Link To Document :
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