Title :
Model-Based Texture Measures
Author :
Schachter, Bruce
Author_Institution :
General Electric Company, Daytona Beach, FL 32015.
fDate :
3/1/1980 12:00:00 AM
Abstract :
Many measures have been developed to quantify the structural properties of image texture. This correspondence explores their applicability to textures generated by several standard models.
Keywords :
Biological system modeling; Euclidean distance; Frequency; Image texture; Image texture analysis; Pattern analysis; Random variables; White noise; Texture measures; texture models;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.1980.4766995
