DocumentCode :
1115902
Title :
Bridging and Stuck-At Faults
Author :
Mei, Kenyon C Y
Author_Institution :
Data Systems Division, Hewlett-Packard
Issue :
7
fYear :
1974
fDate :
7/1/1974 12:00:00 AM
Firstpage :
720
Lastpage :
727
Abstract :
The commonly used stuck-at fault fails to model logic circuit shorts. Bridging faults are defined to model these circuit mal-functions. This model is based on wired logic which is a characteristic of many logic families such as resistor-transistor logic (RTL), diode transistor logic (DTL), emitter-coupled logic (ECL), etc. It does not apply to TTL circuits. The model also limits to fan-out-free leads.
Keywords :
Bridging faults, fault detection, fault dominance, fault modeling, shorts.; Bridge circuits; Circuit faults; Circuit testing; Diodes; Electrical fault detection; Fault detection; Lead; Logic circuits; Printed circuits; Wires; Bridging faults, fault detection, fault dominance, fault modeling, shorts.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1974.224020
Filename :
1672613
Link To Document :
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