Title :
An Examination of Algebraic Test Generation Methods for Multiple Faults
Author :
Carroll, B.D. ; Shah, H.G. ; Jones, D.M.
Author_Institution :
Department of Electrical Engineering, Auburn University
fDate :
7/1/1974 12:00:00 AM
Abstract :
A generalized test function (GTF) is derived that gives all tests for a multiple stuck-at fault in a combinational logic circuit. The GTF is then used as the basis for an examination of several algebraic test generation methods that have appeared in the literature. Deficiencies are found in some methods.
Keywords :
Boolean difference, combinational logic circuits, fault diagnosis, multiple faults, test generation.; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Fault diagnosis; Input variables; Logic testing; Boolean difference, combinational logic circuits, fault diagnosis, multiple faults, test generation.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1974.224024
