DocumentCode :
1116122
Title :
Physical modeling of high-current transients for bipolar transistor circuit simulation
Author :
Jeong, Hanggeun ; Fossum, Jerry G.
Author_Institution :
University of Florida, Gainesville, FL
Volume :
34
Issue :
4
fYear :
1987
fDate :
4/1/1987 12:00:00 AM
Firstpage :
898
Lastpage :
905
Abstract :
Existing bipolar transistor models for circuit simulation are extended to properly account for the possible existence of a high-current-induced space-charge region in the epitaxial collector region. The new physical model thus correctly simulates ohmic and nonohmic quasi-saturation (base push-out), for both steady-state and transient operation. High-current transients are accounted for quasi-statically, using a charge-based formalism. The model is implemented in SPICE, and representative simulations and measurements are presented to demonstrate both model utility and necessity.
Keywords :
Bipolar transistor circuits; Bipolar transistors; Circuit optimization; Circuit simulation; Current density; Delay; SPICE; Semiconductor process modeling; Steady-state; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1987.23013
Filename :
1486724
Link To Document :
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