Title :
Quantum Optical Technologies for Metrology, Sensing, and Imaging
Author :
Dowling, Jonathan P. ; Seshadreesan, Kaushik P.
Author_Institution :
Dept. of Phys. & Astron., Louisiana State Univ., Baton Rouge, LA, USA
Abstract :
Over the past 20 years, bright sources of entangled photons have led to a renaissance in quantum optical interferometry. Optical interferometry has been used to test the foundations of quantum mechanics and implement some of the novel ideas associated with quantum entanglement such as quantum teleportation, quantum cryptography, quantum lithography, quantum computing logic gates, and quantum metrology. In this paper, we focus on the new ways that have been developed to exploit quantum optical entanglement in quantum metrology to beat the shot-noise limit, which can be used, e.g., in fiber optical gyroscopes and in sensors for biological or chemical targets. We also discuss how this entanglement can be used to beat the Rayleigh diffraction limit in imaging systems such as in LIDAR and optical lithography.
Keywords :
light diffraction; light interferometry; optical noise; optical sensors; photodetectors; quantum entanglement; quantum noise; quantum optics; LIDAR; Rayleigh diffraction limit; biological targets; bright sources; chemical targets; fiber optical gyroscopes; optical imaging systems; optical lithography; optical sensing; photon entanglement; quantum computing logic gates; quantum cryptography; quantum entanglement; quantum lithography; quantum mechanics; quantum metrology; quantum optical interferometry; quantum teleportation; shot-noise limit; Metrology; Optical diffraction; Optical interferometry; Optical sensors; Photonics; Quantum entanglement; Heisenberg limit; Quantum entanglement; Quantum metrology; Quantum sensors; quantum entanglement; quantum metrology; quantum sensors;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2014.2386795