• DocumentCode
    1116282
  • Title

    Threshold field and peak-valley velocity ratio in short samples of InP at 300 K

  • Author

    Nag, B.R. ; Ahmed, S.R.

  • Author_Institution
    Calcutta University, Calcutta, India
  • Volume
    34
  • Issue
    5
  • fYear
    1987
  • fDate
    5/1/1987 12:00:00 AM
  • Firstpage
    953
  • Lastpage
    956
  • Abstract
    The transient and steady-state velocity-field characteristics of InP at 300 K are calculated for short samples by using a Monte Carlo model. It is found that the threshold field for negative differential resistance increases with a decrease in the sample length, but the peak-valley velocity ratio is almost independent of the sample length.
  • Keywords
    Computational modeling; Diodes; Electrons; Impurities; Indium phosphide; Lattices; Monte Carlo methods; Scattering; Space charge; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.23029
  • Filename
    1486740