• DocumentCode
    1116454
  • Title

    BJT—MOSFET transconductance comparisons

  • Author

    Warner, R.M., Jr. ; Schrimpf, Ronald D.

  • Author_Institution
    University of Minnesota, Minneapolis, MN
  • Volume
    34
  • Issue
    5
  • fYear
    1987
  • fDate
    5/1/1987 12:00:00 AM
  • Firstpage
    1061
  • Lastpage
    1065
  • Abstract
    Through normalization it becomes possible to construct curves of considerable generality for comparing the transconductance properties of BJT\´s and MOSFET\´s. Three comparisons are given. The first presents transconductance as a function of output current; the second, transconductance divided by output current as a function of input voltage; and the third, transconductance as a function of input voltage. The BJT advantage increases rapidly with output current and (or) input voltage. The curves approach each other under extremely low-level conditions, but appreciable deviations from the simple theory upon which the present analysis is based also occur in the low-level regime--especially deviations connected with subthreshold conduction in the MOSFET, as well as "excess" conduction near but above threshold. For these reasons, the moderate-level portions of the simple-theory comparisons are the most meaningful. Recently developed subthreshold analysis is also used in the second comparison.
  • Keywords
    MOSFET circuits; Microelectronics; Power MOSFET; Subthreshold current; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.23045
  • Filename
    1486756