DocumentCode :
1116731
Title :
Mobility degradation and transferred electron effect in gallium arsenide and indium gallium arsenide
Author :
Arora, Vijay K. ; Mui, David S.L. ; Morkoc, Hadis
Author_Institution :
Wilkes College, Wilkes-Barre, PA
Volume :
34
Issue :
6
fYear :
1987
fDate :
6/1/1987 12:00:00 AM
Firstpage :
1231
Lastpage :
1238
Abstract :
The effect of mobility degradation on the intervalley transfer of electrons in gallium arsenide and indium gallium arsenide is studied. A considerable degradation of the mobility at high electric fields takes place for valleys with high low-field ohmic mobility. The momentum relaxation time τ = m*µ/e is found to degrade with high electric field, giving the impression of high collision broadening at high electric fields. Similar degradation is expected for the mean free path. The relationship of the high-field transport in terms of ohmic transport parameters is elaborated to explain the transferred electron effect.
Keywords :
Electron mobility; Epitaxial layers; Gallium arsenide; Germanium; Gunn devices; Indium gallium arsenide; Indium phosphide; Substrates; Temperature; Thermal degradation;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1987.23075
Filename :
1486786
Link To Document :
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