DocumentCode
1116933
Title
Dynamic error correction of a digitizer for time-domain metrology
Author
Bergman, David I.
Author_Institution
Dept. of Commerce, Nat. Inst. of Stand. & Technol., Washington, DC, USA
Volume
53
Issue
5
fYear
2004
Firstpage
1384
Lastpage
1390
Abstract
A method for numerical correction of distortion in a digitizer used for metrology applications is described. Investigation of the digitizer´s error behavior in the phase plane leads to the development of an analytic error model that describes the digitizer´s distortion behavior. Of particular significance is the model´s ability to describe nonlinear error in the fundamental spectral component manifested as amplitude and frequency-dependent gain and phase error. When fitted only to the harmonic distortion content of the digitizer´s output data, the model generates an amount of fundamental that correctly accounts for the error in the digitizer´s gain that is not due to linear system response. The model is therefore able to improve not just the total harmonic distortion (THD) performance of the digitizer but its ac root mean square measurement accuracy as well. At 1 MHz, the model linearizes the digitizer to 70 μV/V over a range of 1 to 8 V and reduces harmonic distortion by >20 dB. It is believed that this is the first time that results of this nature have been reported in the literature.
Keywords
analogue-digital conversion; error correction; harmonic distortion; time-domain analysis; 1 MHz; 1 to 8 V; ac root mean square measurement; amplitude gain; analog-to-digital converter; analytic error model; digitizer; dynamic error correction; frequency-dependent gain; harmonic distortion content; linear regression; linear system response; metrology applications; nonlinear error; numerical correction; phase error; phase plane; spectral component; time-domain metrology; total harmonic distortion; Error analysis; Error correction; Frequency; Harmonic distortion; Linear systems; Metrology; Phase distortion; Root mean square; Time domain analysis; Total harmonic distortion; Analog-to-digital converter; distortion; error model; linear regression; phase plane;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2004.834095
Filename
1337295
Link To Document