DocumentCode :
1116933
Title :
Dynamic error correction of a digitizer for time-domain metrology
Author :
Bergman, David I.
Author_Institution :
Dept. of Commerce, Nat. Inst. of Stand. & Technol., Washington, DC, USA
Volume :
53
Issue :
5
fYear :
2004
Firstpage :
1384
Lastpage :
1390
Abstract :
A method for numerical correction of distortion in a digitizer used for metrology applications is described. Investigation of the digitizer´s error behavior in the phase plane leads to the development of an analytic error model that describes the digitizer´s distortion behavior. Of particular significance is the model´s ability to describe nonlinear error in the fundamental spectral component manifested as amplitude and frequency-dependent gain and phase error. When fitted only to the harmonic distortion content of the digitizer´s output data, the model generates an amount of fundamental that correctly accounts for the error in the digitizer´s gain that is not due to linear system response. The model is therefore able to improve not just the total harmonic distortion (THD) performance of the digitizer but its ac root mean square measurement accuracy as well. At 1 MHz, the model linearizes the digitizer to 70 μV/V over a range of 1 to 8 V and reduces harmonic distortion by >20 dB. It is believed that this is the first time that results of this nature have been reported in the literature.
Keywords :
analogue-digital conversion; error correction; harmonic distortion; time-domain analysis; 1 MHz; 1 to 8 V; ac root mean square measurement; amplitude gain; analog-to-digital converter; analytic error model; digitizer; dynamic error correction; frequency-dependent gain; harmonic distortion content; linear regression; linear system response; metrology applications; nonlinear error; numerical correction; phase error; phase plane; spectral component; time-domain metrology; total harmonic distortion; Error analysis; Error correction; Frequency; Harmonic distortion; Linear systems; Metrology; Phase distortion; Root mean square; Time domain analysis; Total harmonic distortion; Analog-to-digital converter; distortion; error model; linear regression; phase plane;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2004.834095
Filename :
1337295
Link To Document :
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