INL and DNL estimation based on noise for ADC test

Author

Flores, Maria Da Glória Cataldi ; Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro A.

Author_Institution

Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil

Volume

53

Issue

5

fYear

2004

Firstpage

1391

Lastpage

1395

Abstract

This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and practical results supporting the effectiveness of the proposed method.

Keywords

analogue-digital conversion; built-in self test; error analysis; linearisation techniques; measurement theory; DNL estimation; INL estimation; analog-to-digital characterization; analog-to-digital converter; built-in self-test; converter output; differential nonlinearity estimation; input signal; linearity characterization; linearity error estimation; noise-based ADC test; noise-based integral nonlinearity; spectral analysis; Analog-digital conversion; Built-in self-test; Circuit testing; Error correction; Histograms; Integrated circuit noise; Linearity; Signal analysis; Signal processing; Spectral analysis; ADC; Analog-to-digital; BIST; DNL; INL; and differential nonlinearity; built-in self-test; characterization; estimation; for ADC; noise-based ADC test; noise-based integral nonlinearity;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2004.834096

Filename

1337296