Title :
INL and DNL estimation based on noise for ADC test
Author :
Flores, Maria Da Glória Cataldi ; Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro A.
Author_Institution :
Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and practical results supporting the effectiveness of the proposed method.
Keywords :
analogue-digital conversion; built-in self test; error analysis; linearisation techniques; measurement theory; DNL estimation; INL estimation; analog-to-digital characterization; analog-to-digital converter; built-in self-test; converter output; differential nonlinearity estimation; input signal; linearity characterization; linearity error estimation; noise-based ADC test; noise-based integral nonlinearity; spectral analysis; Analog-digital conversion; Built-in self-test; Circuit testing; Error correction; Histograms; Integrated circuit noise; Linearity; Signal analysis; Signal processing; Spectral analysis; ADC; Analog-to-digital; BIST; DNL; INL; and differential nonlinearity; built-in self-test; characterization; estimation; for ADC; noise-based ADC test; noise-based integral nonlinearity;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2004.834096
