DocumentCode
1117571
Title
Critical currents of semiconductor-coupled Josephson weak links
Author
Kleinsasser, A.W.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
27
Issue
2
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
2589
Lastpage
2593
Abstract
Critical currents of semiconductor-coupled Josephson weak links, including Josephson field effect transistors, are discussed with emphasis on experimental results. Phenomenological expressions are used illuminate outstanding issues. Recent experiments are described which could lead to improved understanding of the superconductor-semiconductor interfaces of key importance in these devices
Keywords
Josephson effect; critical currents; field effect transistors; superconducting junction devices; Josephson field effect transistors; semiconductor-coupled Josephson weak links; superconductor-semiconductor interfaces; Boundary conditions; Charge carrier density; Critical current; FETs; Insulation; Proximity effect; Superconducting devices; Superconducting materials; Tin; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.133745
Filename
133745
Link To Document