• DocumentCode
    1117740
  • Title

    TAB inner-lead bond process characterization for single-point laser bonding

  • Author

    Wesling, Paul ; Emamjomeh, Ali

  • Author_Institution
    Tandem Comput. Inc., Cupertino, CA, USA
  • Volume
    17
  • Issue
    1
  • fYear
    1994
  • fDate
    3/1/1994 12:00:00 AM
  • Firstpage
    142
  • Lastpage
    148
  • Abstract
    Characterization of new equipment and processes is necessary prior to initiation of a production effort using a developing technology, such as tape-automated bonding (TAB). In this paper, results are presented for a set of experiments used to characterize a process for performing inner-lead bonding (ILB) using a continuous-wave (CW) laser. Three key parameters were selected for initial analysis: the force exerted by the bonding stylus; the laser power; and the on-time of the laser. Using a Box-Behnken statistical design for the experiment, an efficient set of tests was derived. Four sets of experimental samples were fabricated, to be used for the as-fabricated testing, high-temperature aging, and thermal cycling; only the as-fabricated results are reported here. Using a Design-of-Experiments software package for the PC, a quadratic equation was derived from the data explicitly defining the relationships among the three parameters and relating them to bond strength. Through a rearrangement of the existing data, an additional correlation was derived for lead misalignment. Using the techniques of surface response methodology, a response surface was created, showing the optimum operating region for the ILB process based on the parameter range chosen. Initial operating parameters are reported for continuous-wave laser bonding
  • Keywords
    failure analysis; laser beam applications; mechanical strength; statistical analysis; tape automated bonding; Box-Behnken statistical design; CW laser; Design-of-Experiments software package; ILB process; TAB inner-lead bond; bond process characterization; bond strength; bonding stylus force; continuous-wave laser; high-temperature aging; laser on-time; laser power; lead misalignment; production; quadratic equation; single-point laser bonding; surface response methodology; tape-automated bonding; testing; thermal cycling; Bonding forces; Circuit testing; Equations; Integrated circuit technology; Lead; Multichip modules; Power lasers; Production; Response surface methodology; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.296381
  • Filename
    296381