DocumentCode
1117870
Title
Three-Dimensional Simulation of One-Dimensional Transport in Silicon Nanowire Transistors
Author
Fiori, Gianluca ; Iannaccone, Giuseppe
Author_Institution
Univ. di Pisa, Pisa
Volume
6
Issue
5
fYear
2007
Firstpage
524
Lastpage
529
Abstract
We present a simulation study of silicon nanowire transistors, based on an in-house code providing the self-consistent solution of Poisson, Schrodinger, and continuity equations on a generic three-dimensional domain. The main assumption, based on the very small nanowire cross section considered, is that an adiabatic approximation can be applied to the Schrodinger equation, so that transport occurs along one-dimensional sub- bands. Different subband transport models are considered, such as ballistic transport, either including quantum tunneling or not, and drift-diffusion. We show that nanowire transistors exhibit good control of short channel effects, and that barrier tunneling is significant in the strong inversion regime even for longer devices, while it is significant in subthreshold only for the shortest channel lengths. Finally, we show that a subband-based transport model allows to reach a very good trade off between physical accuracy of the simulation and computing time.
Keywords
Poisson equation; Schrodinger equation; ballistic transport; diffusion; elemental semiconductors; nanowires; semiconductor device models; semiconductor quantum wires; silicon; Poisson solution; Schrodinger equation; Si interface; ballistic transport; drift-diffusion; quantum tunneling; self-consistent solution; semiconductor device simulation; silicon nanowire transistors; transport model; Ballistic transport; Computational modeling; Effective mass; Electrostatics; MOSFETs; Nanoscale devices; Poisson equations; Schrodinger equation; Silicon; Tunneling; 1-D subbands; Ballistic transport; Poisson/SchrÖdinger; drift-diffusion; silicon nanowire transistor; three-dimensional;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2007.896844
Filename
4301387
Link To Document