Title :
Temperature and Excitation Dependence of Photoluminescence Spectra of InAs/GaAs Quantum Dot Heterostructures
Author :
Nee, Tzer-En ; Wu, Ya-Fen ; Lee, Jiunn-Chyi ; Wang, Jen-Cheng
Author_Institution :
Chang Gung Univ., Tao-Yuan
Abstract :
In this study we investigated the effects that the carrier dynamics have on the temperature- and excitation-intensity- dependent photoluminescence (PL) spectra of a self-assembled quantum dot heterostructure. A rate equation model is proposed to take into account the dot size distribution, the random population of density of states, state filling effects, and the important carrier transfer mechanisms for the quantum dot system, including carrier capture, relaxation, thermal emission, and retrapping. This model reproduces the PL spectra quite well. Our quantitative calculations of the behavior of the thermal emitting carriers under various incident power intensities within the temperature range 15 K-240 K explain the carrier transfer process quite reasonably for the quantum dot system. In addition, we discuss the thermal redistribution and state filling effects in detail in our analysis of the dependence of the PL spectra on the temperature and excitation power intensity applied to the sample. Index
Keywords :
III-V semiconductors; electron traps; electronic density of states; excited states; gallium arsenide; indium compounds; photoluminescence; self-assembly; semiconductor quantum dots; spectral line intensity; InAs-GaAs; carrier dynamics; carrier transfer mechanisms; density of states; dot size distribution; excitation intensity dependency; photoluminescence spectra; random population; rate equation model; retrapping; self-assembled quantum dot heterostructure; state filling effects; temperature 15 K to 240 K; temperature dependency; thermal emission; thermal emitting carriers; Equations; Filling; Gallium arsenide; Photoluminescence; Power system modeling; Quantum dot lasers; Quantum dots; Shape; Stimulated emission; Temperature dependence; Photoluminescence; quantum dots; simulation;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2007.903796