DocumentCode :
1118053
Title :
Physical scaling and interconnection delays in multichip modules
Author :
Frye, Robert C.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
17
Issue :
1
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
30
Lastpage :
37
Abstract :
This papers analyzes the ways that physical scaling of electrical interconnecting structures impacts their delays, with particular focus on multichip modules. We use for illustration example structures typical of laminate and thin-film based MCMs. Because multichip modules have higher packaging densities than conventional packaging, loading plays a correspondingly more important role in their delays. The most important parameters dominating the performance of MCMs are the average distance between the chips (i.e. the packaging density), the size of the load capacitance and the number of loads connected to the line. Focusing attention on these areas has the greatest potential to improve MCM performance, regardless of the particular substrate technology
Keywords :
capacitance; delays; integrated circuit technology; multichip modules; thin film circuits; electrical interconnecting structures; interconnection delays; laminate MCMs; load capacitance; loading; multichip modules; packaging density; physical scaling; thin-film based MCMs; Bandwidth; CMOS technology; Degradation; Electromagnetic propagation; Frequency; Integrated circuit interconnections; Multichip modules; Packaging; Propagation delay; Transmission lines;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.296428
Filename :
296428
Link To Document :
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