• DocumentCode
    1118090
  • Title

    Design optimization of JCMOS structures

  • Author

    Eldin, Ali G. ; Elmasry, Mohamed I.

  • Author_Institution
    Bell Northern Research, Ottawa, Canada
  • Volume
    34
  • Issue
    10
  • fYear
    1987
  • fDate
    10/1/1987 12:00:00 AM
  • Firstpage
    2136
  • Lastpage
    2145
  • Abstract
    JCMOS structures are based on merging an MOS capacitance, a JFET, and a bipolar transistor in an area of a single MOS transistor. The structure performs the basic operations of temporary storage, writing, and sensing of the stored data. It is used in DRAM, serial dynamic memory, and dynamic logic applications. In addition to the advantages of small size and high speed of operation, the use of the JCMOS structure to implement dynamic logic gates overcomes the problem of charge redistribution associated with conventional and domino CMOS logic circuits. In this paper, the JCMOS structure implementation using a retrograde p-well CMOS process is presented. An analytical model relating terminal voltages and currents to device dimensions and doping levels is derived. Simulation results are presented for both reading and writing modes of operation. A test cell was successfully fabricated to verify the principle of operation, and experimental and theoretical results are compared. A simplified lumped component equivalent circuit, to be used in circuit simulators such as SPICE, is presented, and its validity is investigated. The structure design requirements and procedure are presented. The model is used to optimize the design of the structure.
  • Keywords
    Bipolar transistors; CMOS logic circuits; Capacitance; Circuit simulation; Design optimization; Logic gates; MOSFETs; Merging; Random access memory; Writing;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.23208
  • Filename
    1486919