• DocumentCode
    1118354
  • Title

    Design of Reliable Synchronous Sequential Circuits

  • Author

    Sawin, Dwight H., III

  • Author_Institution
    Communication/Automatic Data Processing Laboratory, U. S. Army Electronics Command
  • Issue
    5
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    567
  • Lastpage
    570
  • Abstract
    Fail-safe synchronous sequential machines produce safeside outputs when failures occur within the machine. This correspondence presents a procedure to design such machines using a modification of the on-set equation form originally presented by Tohma et al. [1] and later improved by Diaz et al. [2]. A systematic procedure for state assignment and next-state equation derivation, using partition theory, is presented. From this method an easily calculated upper bound on the number of gates required-to realize a fail-safe circuit is derived.
  • Keywords
    Fail-safe design, fault-detection, reliable design, state assignments, synchronous sequential machine design.; Automatic control; Centralized control; Circuit faults; Circuit testing; Digital systems; Electrical fault detection; Equations; Hardware; Sequential circuits; System testing; Fail-safe design, fault-detection, reliable design, state assignments, synchronous sequential machine design.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1975.224262
  • Filename
    1672855