DocumentCode :
1118354
Title :
Design of Reliable Synchronous Sequential Circuits
Author :
Sawin, Dwight H., III
Author_Institution :
Communication/Automatic Data Processing Laboratory, U. S. Army Electronics Command
Issue :
5
fYear :
1975
fDate :
5/1/1975 12:00:00 AM
Firstpage :
567
Lastpage :
570
Abstract :
Fail-safe synchronous sequential machines produce safeside outputs when failures occur within the machine. This correspondence presents a procedure to design such machines using a modification of the on-set equation form originally presented by Tohma et al. [1] and later improved by Diaz et al. [2]. A systematic procedure for state assignment and next-state equation derivation, using partition theory, is presented. From this method an easily calculated upper bound on the number of gates required-to realize a fail-safe circuit is derived.
Keywords :
Fail-safe design, fault-detection, reliable design, state assignments, synchronous sequential machine design.; Automatic control; Centralized control; Circuit faults; Circuit testing; Digital systems; Electrical fault detection; Equations; Hardware; Sequential circuits; System testing; Fail-safe design, fault-detection, reliable design, state assignments, synchronous sequential machine design.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1975.224262
Filename :
1672855
Link To Document :
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