DocumentCode :
1118364
Title :
Transient Failures in Triple Modular Redundancy Systems with Sequential Modules
Author :
Wakerly, John F.
Author_Institution :
Digital Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University
Issue :
5
fYear :
1975
fDate :
5/1/1975 12:00:00 AM
Firstpage :
570
Lastpage :
573
Abstract :
The effects of transient failures in sequential modules in systems using triple modular redundancy (TMR) cannot be neglected. A transient may place a sequential machine in an erroneous state, and the state may remain erroneous long after the transient has disappeared. We show that the state of a sequential machine can be restored after a transient if and only if the machine has a synchronizing sequence. If synchronizing sequences occur periodically during normal operation of the system, then multiple transients spaced out in time can be tolerated. System structures that have synchronizing sequences are discussed.
Keywords :
Fault-tolerant computing, intermittent failures, microcomputers, N-modular redundancy, sequential machines, synchronization, transient failures, triple modular redundancy.; Counting circuits; Digital systems; Microcomputers; Redundancy; Relays; Voting; Fault-tolerant computing, intermittent failures, microcomputers, N-modular redundancy, sequential machines, synchronization, transient failures, triple modular redundancy.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1975.224263
Filename :
1672856
Link To Document :
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