Abstract :
A probabilistic treatment of general combinational networks has been developed. Using the notions of the probability of a signal and signal independence, algorithms have been presented to calculate the probability of the output of a logic circuit being 1. Simplifications to the algorithm result when sets of input probabilities are given the same value, and this process called bundling is described in the paper. Finally, a series of examples illustrate the application of the probabilistic approach to the analysis of faulty logic circuits.
Keywords :
Boolean difference, fault detection, general combinational networks, input probability, iterative cells, output probability, probability, signal reliability, symmetric functions, test generation.; Boolean functions; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Logic circuits; Probabilistic logic; Probability; Signal analysis; Signal processing; Boolean difference, fault detection, general combinational networks, input probability, iterative cells, output probability, probability, signal reliability, symmetric functions, test generation.;
