• DocumentCode
    1118387
  • Title

    Two-dimensional effects in the bipolar polysilicon self-aligned transistor

  • Author

    Verret, Douglas P. ; Brighton, Jeffrey E.

  • Author_Institution
    Texas Instruments Incorporated, Houston, TX
  • Volume
    34
  • Issue
    11
  • fYear
    1987
  • fDate
    11/1/1987 12:00:00 AM
  • Firstpage
    2297
  • Lastpage
    2303
  • Abstract
    There has been a great deal of interest recently in the performance enhancements afforded by self-aligned silicon transistors. Concomitantly, it has been observed that the current gain and collector drive capability of these devices sometimes exhibit a strong dependence an the geometrical size and shape of the emitter, In this study, it has been shown that this two-dimensional effect is explicable in terms of a parasitic p-n diode in parallel with the emitter-base junction. An accurate model has been developed to predict the geometry-dependent current gain under low to moderate bias. It is further shown how the model can be extended to the high-bias regime. Lastly, it is shown, by means of an emitter-base debiasing model, that the geometry of the emitter contact has a more significant effect on the emitter-base debiasing than does the intrinsic base sheet resistance itself.
  • Keywords
    Contact resistance; Diodes; Gallium arsenide; Geometry; Integrated circuit modeling; P-n junctions; Predictive models; Shape; Silicon; Solid modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.23235
  • Filename
    1486946