DocumentCode :
1118564
Title :
Fail-Safe Asynchronous Sequential Machines
Author :
Sawin, Dwight H., III ; Maki, Gary K.
Author_Institution :
Communications/ADP Laboratory, U. S. Army Electronics Command
Issue :
6
fYear :
1975
fDate :
6/1/1975 12:00:00 AM
Firstpage :
675
Lastpage :
677
Abstract :
Fail-safe circuits are designed to assume a 1 (1-fail-safe) or a 0 (0-fail-safe) output state upon failure. This correspondence extends fault detection techniques previously presented [1] to include the design of fail-safe asynchronous sequential circuits. Faults causing failures in the internal state logic and the output state logic circuitry are treated. These failures are assumed to be symmetric and the resulting circuit realizations require less hardware than realizations derived from previously presented techniques.
Keywords :
Asynchronous sequential machine design, fail-safe design, fault-tolerant computing, internal state assignments, reliability.; Circuit faults; Crosstalk; Electrical fault detection; Hardware; Lighting control; Logic circuits; Logic design; Protection; Roads; Sequential circuits; Asynchronous sequential machine design, fail-safe design, fault-tolerant computing, internal state assignments, reliability.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1975.224282
Filename :
1672875
Link To Document :
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