Title :
An Algorithm for the Generation of Test Sets for Combinational Logic Networks
fDate :
7/1/1975 12:00:00 AM
Abstract :
An algorithm is developed for generating a single-fault detection test set to be used in a combinational logic network. This algorithm has two unique characteristics. 1) When a test is generated, a list of faults detected by this test is available. Fault simulation, therefore, is not required after the test has been generated. 2) It generates a test set rather than a single test. Each test, with the exception of the first one, is based on a previous test. Repetition of effort and overlapped coverage of faults for different test generations are thus reduced.
Keywords :
Combinational networks, criticality of line values under test, fault detection, test generation, test set generation.; Character generation; Dictionaries; Fault detection; Fault diagnosis; Graphics; Logic testing; Performance evaluation; Combinational networks, criticality of line values under test, fault detection, test generation, test set generation.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1975.224295
