DocumentCode :
1118720
Title :
Properties of Faults and Criticalities of Values under Tests for Combinational Networks
Author :
Wang, David T.
Author_Institution :
System Products Division, IBM Corporation
Issue :
7
fYear :
1975
fDate :
7/1/1975 12:00:00 AM
Firstpage :
746
Lastpage :
750
Abstract :
This correspondence discusses the properties of faults in combinational networks and their relationships with fault-detection and fault-location test sets.
Keywords :
Criticality of values under test, fault equivalence, fault detection, fault dominance, fault location, fault masking, test generation.; Decoding; Fault detection; Joining processes; Testing; Criticality of values under test, fault equivalence, fault detection, fault dominance, fault location, fault masking, test generation.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1975.224296
Filename :
1672889
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1118720
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