Author :
Pradhan, D.K. ; Reddy, S.M.
fDate :
7/1/1975 12:00:00 AM
Abstract :
Sawin and Maki make the three following observations.
Keywords :
Circuit faults; Design methodology; Equations; Fault detection; Fault tolerance; Hardware; Logic design; Sequential circuits; Synchronous machines; Testing;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1975.224300
