DocumentCode :
1119027
Title :
VA-6 Investigation of stress effects on the DC characteristics of GaAs MESFET´s through the use of externally applied loads
Author :
McNally, P.J. ; Ramirez, J. ; Cooper, L.S. ; Rosenberg, J.J. ; Freund, L.B. ; Jackson, Thomas N.
Volume :
34
Issue :
11
fYear :
1987
fDate :
11/1/1987 12:00:00 AM
Firstpage :
2377
Lastpage :
2377
Keywords :
Dielectric substrates; Dielectric thin films; Gallium arsenide; MESFETs; Piezoelectric effect; Piezoelectric films; Residual stresses; Stress measurement; Thermal stresses; Threshold voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1987.23298
Filename :
1487009
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1119027
