DocumentCode
1119060
Title
Scenario normalization techniques - inline stepper coordinator design
Author
Chung, Sheng-Luen ; Jeng, MuDer
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taiwan
Volume
11
Issue
3
fYear
2004
Firstpage
14
Lastpage
21
Abstract
In this paper, the scenario normalization technique is addressed, which is very useful in the context of generic equipment control, where an equipment-control system (ECS) is to control several pieces of equipment, possibly of different types. This paper begins with a background introduction to a photolithographic cell and the concept of generic equipment control adopted in semiconductor fabs. The concept of message modulation that translates in semantics context the sequence flows between the high-level ECS and the low-level equipment is presented. The main idea relies on the operational scenarios modeling by the sequence diagram; message translation based on semantics analysis; the derivation of production rules and the implementation of them on an event-triggering platform. Scenarios, thus obtained and presented to the high-level ECS by the coordinator, are then in compliance with the normalized scenario as required by the generic equipment controller. The significance of the proposed normalization techniques has the following implication: when different equipment are included in a cell operation, it is not necessary to rewrite control programs but to add relatively simpler transformation sequences enabling the use of the standard ECS function. From the control point of view, the controlled systems of stepper and track can be modeled as discrete event dynamic ones if operation coordination is considered.
Keywords
control engineering computing; discrete event systems; manufacturing systems; materials handling; photolithography; semiconductor device manufacture; discrete event dynamic system; equipment-control system; event-triggering platform; generic equipment control; inline stepper coordinator design; photolithographic cell; scenario normalization techniques; semantics analysis; semiconductor fabs; stepper and track controlled systems; Automatic control; Communication system control; Control systems; Job shop scheduling; Manufacturing automation; Planarization; Production; Robotics and automation; Semiconductor device manufacture; Tracking;
fLanguage
English
Journal_Title
Robotics & Automation Magazine, IEEE
Publisher
ieee
ISSN
1070-9932
Type
jour
DOI
10.1109/MRA.2004.1337823
Filename
1337823
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