DocumentCode :
1119098
Title :
Reliability Analysis of Systems with Concurrent Error Detection
Author :
Ramamoorthy, C.V. ; Han, Yih-wu
Author_Institution :
Department of Electrical Engineering and Computer Sciences and the Electronics Research Laboratory, University of California
Issue :
9
fYear :
1975
Firstpage :
868
Lastpage :
878
Abstract :
There is an increasing use of error detectors and correctors in computer subsystems, such as parity detectors in memory modules and residue checkers in arithmetic units. Their fault tolerant characteristics are studied through the model of detector redundant systems. Their reliabilities and availabilities are analyzed and compared with those which do not have any such error detectors. The design of fault isolating and reconfiguring networks used in the implementation of such systems are developed.
Keywords :
Availability, critical reliability of detector, detector redundant system, hybrid (N, S), N-tuple modular redundant system, reconfiguration switch, subsystem, triple modular redundant system, validating gate.; Availability; Circuit faults; Computer errors; Detectors; Error correction; Fault detection; Integrated circuit reliability; Nuclear magnetic resonance; Random access memory; Switches; Availability, critical reliability of detector, detector redundant system, hybrid (N, S), N-tuple modular redundant system, reconfiguration switch, subsystem, triple modular redundant system, validating gate.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1975.224332
Filename :
1672925
Link To Document :
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