Title :
VIB-5 Investigation of electron drift velocity in MOSFET´s using a grating gate electrode
Author :
Bair, L.A. ; Antoniadis, Dimitri A. ; Sodini, Charlie G.
fDate :
11/1/1987 12:00:00 AM
Keywords :
Bridge circuits; Dielectric constant; Electric breakdown; Electric variables measurement; Electrodes; Electron mobility; Gratings; MOSFET circuits; Magnetic field measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.23318
